ISMI Manufacturing Week
“Wait Time Waste Metrics”
Tuesday November 2
8AM-12PM
Facilitators: Bradley Van Eck and Marlin Shopbell, ISMI
The largest contributors to Wait Time Waste in wafer fabrication are: idle time prior to dispatching, delivery, verification and setup prior to the start of wafer processing; and wait time within a process or metrology equipment that occurs during processing of a wafer, between wafers, and between lots.
This workshop will provide a forum to introduce the concept of “Wait Time Waste” metrics to the semiconductor industry. These metrics will define and measure time lost to non-value added activities during wafer manufacturing. The concept of waste metrics was added in the 2009 ITRS Factory Integration chapter.
Workshop Objectives
- Proposed definitions, measurement methodologies, and data visualization approaches for these metrics.
- Examples using selected process and metrology equipment will be given to demonstrate typical elements of wait time waste.
Participants will gain an understanding of the definition and use of Wait Time Waste concepts as an alternative method for identifying, measuring, and improving factory and equipment productivity.
About the Facilitators
Bradley Van Eck is a project manager in the Next Generation Factory Program within ISMI, where he serves as the project leader for the Seamless Cascading project. Van Eck is chairman of the AEC/APC Symposium and also serves on the Factory Integration Technical Working Group for the ITRS.
Marlin Shopbell, P.E., is a project engineer in the Next Generation Factory Program within ISMI, where he provides technical guidance to the Wait Time Waste Metrics Project. Shopbell has over 40 years of experience in the semiconductor industry. He most recently was involved in 300mm factory startups at AMD and Spansion.
Who Should Attend
Attendance at this workshop is open to device manufacturers, equipment suppliers, and others who have an interest in learning about a new approach to measuring productivity by measuring the lost opportunities occurring during manufacturing.
How To Register
You must register to attend this workshop. This workshop is open to the public at no charge.
